Morphologic Investigations with X-ray Tomographic Microscopy (XTM) using Synchrotron Radiation

摘要

For the next time the XTM system at the material science beamline will continue to be a very good system for biological samples and materials with densities less than the density of silicon. Higher density ceramic materials such as Zirconia may be scanned provided the diameter will be less than a few hundreds of μm. On an extended time frame quantitative holotomography and higher energies will be available.