OPTICAL LOW-COHERENCE REFLECTOMETRY FOR NONDESTRUCTIVE PROCESS MEASUREMENTS

摘要

Optical Low-Coherence Reflectometry (OLCR) is a white-light interference technique which can be used as a sensor in a number of processing applications. Research at the Center for Process Analytical Chemistry focuses on analysis of both transparent and highly-scattering materials. OLCR has been applied to monitor the thickness of polymer films and clear coatings on scattering matrices. Additional process applications include fermentation monitoring and non-invasive thickness determination of highly scattering coatings on both conducting and non-conducting substrates.