Today's application-oriented production test of integrated circuits used in contactless applications, falling in the frequency range below 20MHz, like SmartCards (e.g. banking cards, cellular telephones) or TAGs (e.g. pricing labels, baggage identification tags) requires extensive external circuitry on the probe card or device interface board and limits the parallel test to 1 to 3 devices. A new test solution, embedded into standard ATE and capable of performing true parallel test of up to 32 RFID devices directly through the 2-pin antenna interface, without additional external circuits, will be presented in this paper.
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