首页> 外文会议>Conference on Corrosion 2001, 2001 >Adsorbed Inhibitor Fragments Observed on Alloyed Thin Films Identified by TOF-SIMS
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Adsorbed Inhibitor Fragments Observed on Alloyed Thin Films Identified by TOF-SIMS

机译:用TOF-SIMS鉴定合金薄膜上吸附的抑制剂片段

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Time-of-Flight Secondary Ion Mass Spectroscopy TOFSIMS was used to identify the different fragmented species associated with the adsorption of a triazole based inhibitor on alloyed thin films. Copper, cobalt-iron, nickel-manganese, and nickel-iron alloyed films were immersed in an inhibited aqueous solution. Inspection of the positive and negative spectra indicated different fragmented complexes of the inhibitor. In some cases the primary metal of the alloy was where the inhibitor fragments adsorbed thus excluding or lightly covering the secondary alloy. In many cases there are different and unique ratios of inhibitor fragments to metal sites. The different ratios could equate to the protection efficacy of the inhibitor per metal protected and add insight to the bonding of the inhibitor to the substrate. In addition, it is suspected that alloy selection may have an impact on the efficacy of an inhibitor.
机译:飞行时间二次离子质谱仪TOFSIMS用于鉴定与三唑类抑制剂在合金薄膜上的吸附有关的不同碎片。将铜,钴铁,镍锰和镍铁合金膜浸入受抑制的水溶液中。对正和负光谱的检查表明了抑制剂的不同碎片复合物。在某些情况下,合金的主要金属是抑制剂碎片被吸附的位置,因此排除或轻微覆盖了次要合金。在许多情况下,抑制剂片段与金属位点的比率不同且独特。不同的比例可以等同于每种被保护金属的抑制剂的保护功效,并增加了抑制剂与底物之间的结合力。另外,怀疑合金的选择可能对抑制剂的功效有影响。

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