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Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique

机译:使用单色高速成像技术评估开关设备中的放气材料

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The purpose of this paper is to investigate quantitative information on prospective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging techniques were employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among prospective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials.
机译:本文的目的是研究有关在开关设备中使用的预期放气材料的定量信息。先前的工作表明,放气材料对这些设备中的电流中断和电流限制有很大的影响。但是,很少有论文涉及当放气材料暴露于运行电弧时释放的某些放气物质(例如氢)的数量的定量信息。在这项研究中,采用单色高速成像技术分别基于氢弧图像和氮弧图像表征不同材料的氢气释放特性。氢等离子体具有很高的导热率,在中断期间会导致高电弧电压,这对于限制电流至关重要。比较了预期的放气材料。从等离子体发射强度得出的质量损失结果与放气材料的直接质量损失测量结果显示出良好的一致性。

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