It is shown that Si photoconductive semiconductor switches (PCSSs)can be used to switch high voltages (up to 123 kV), high fields (up to82 kV/cm) and high currents (2.8 kA). The ability of the samples towithstand this type of high-voltage, high-current switching depends onthe way in which the current penetrates the semiconductor. Theappropriate use of water or contacts greatly improves the switchingcapability. It is also shown that the wafers can support large currents(4.0 kA for GaAs and 2.8 kA for Si) and large linear current densities(3.2 kA/cm for GaAs and 1.4 kA/cm for Si). For GaAs, this linear currentdensity corresponds to about 1 MA/cm2, given a penetrationdepth of about 10-3 cm. It is determined that the lock-onphenomenon can be triggered with light of varying photon energy to reacha lock-on field that is both impurity-concentration andsample-temperature dependent
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机译:显示了Si光电导半导体开关(PCSS)
可用于切换高压(最高123 kV),高压场(最高
82 kV / cm)和大电流(2.8 kA)。样本的能力
承受这种类型的高压,大电流开关取决于
电流穿透半导体的方式。这
适当使用水或触点可大大改善开关
能力。还显示出晶片可以支持大电流
(GaAs为4.0 kA,Si为2.8 kA)和大的线性电流密度
(GaAs为3.2 kA / cm,Si为1.4 kA / cm)。对于砷化镓,此线性电流
给定穿透力,密度大约相当于1 MA / cm 2 sup>
深度约10 -3 sup> cm。确定锁定
可以用变化的光子能量的光来触发这种现象
既有杂质浓度又有杂质的锁定场
样品温度依赖性
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