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Influence of hydrogen plasma processing on gas sensitivie tin dioxide thin film properties

机译:氢等离子体处理对气敏氧化锡薄膜性能的影响

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The influence of glow discharge hydrogen plasma processing on undoped tin dioxide (SnO_2) thin film structure and properties have been investigated. The films of 150 - 200 nm thickness were deposited by a method of magnetron sputtering on Al_2O_3 substrate at the temperature of this one 250 deg C with a rate of 1.5 - 2.0 nm/min in argon - oxygen mixture atmosphere. It was shown these films are amorphous just after fabrication, theirs polycrystalline structure appears after annealing and disappears after processing in the hydrogen plasma. Such a processing expands a temperature rang eof film sensitivity to ethanol and heptane vapors, increases the sensitivity to low concentration of those.
机译:已经研究了辉光放电氢等离子体处理对未掺杂的锡二氧化钛(SnO_2)薄膜结构和性质的影响。通过在氩气混合物气氛中的1.5-2.0nm / min的温度下,通过在Al_2O_3底物上的磁控溅射的方法沉积150-200nm厚的薄膜。它显示出这些薄膜在制造后是无定形的,在退火后,它们的多晶结构出现并在氢等离子体中加工后消失。这种加工扩展了对乙醇和庚烷蒸汽的温度响应膜敏感性,增加了对低浓度的敏感性。

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