ADI-FMM, a customized FMEA for process management in the IC assembly and test industry

摘要

Analog Devices, Inc. has developed the failure mechanism methodology as a customized FMEA for integrated circuit assembly and testing. This system, an integrated approach towards process management involves the generation of two dimensional matrices relating failure mechanisms to product attributes to process variables, controls, in-line and time zero monitors. The system also allows for the identification of relevant short loop and long loop reliability stresses for process qualifications. Two-dimensional matrices relating failure mechanisms to assembly design rules and test blocks also provide product and package designers with an up-front assessment of the expected performance of their designs.