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Thermo-optical characterization of a low-background infrared chamber and wideband infrared scene projector (WISP) array for hardware-in-the-loop testing

机译:用于硬件在环测试的低背景红外室和宽带红外场景投影仪(WISP)阵列的热光表征

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Abstract: The KHILS Vacuum Cold Chamber (KVACC) provides the capability of testing IR seekers with scenes involving a `cold' background, more closely simulating a high altitude/exoatmospheric engagement. During the past year, a gaseous helium refrigeration system has been installed to simplify the logistics of cooling the chamber. An antechamber has also been installed to serve as a chamber for the sensor under test. A WISP array was installed in the Source Chamber. A thermal control system was developed by connecting the array to a cold surface by way of a thermal choke, then actively controlling the temperature with heating elements. This made it possible to operate the array at user selected, stable substrate temperatures ranging from ambient temperature to below 150 K. This capability makes it possible to select the infrared background level that the array operates at, and to operate with background levels that are adequate for testing the high altitude/exoatmospheric engagements. WISP arrays were designed for room temperature operation, but predicted performance at reduced temperatures appears acceptable. Tests were performed with a Phase I prototype WISP array inside the KVACC Source Chamber. Data on this array's radiometric response at various substrate temperatures are presented. It is demonstrated that the arrays can be operated at substrate temperatures as low as 145 K. Currently two Phase 3 WISP arrays and a dichroic beam combiner are being installed in the Source Chamber for 2- color testing.!3
机译:摘要:KHILS真空冷室(KVACC)能够测试带有“冷”背景的场景的红外搜索器,更紧密地模拟高海拔/大气层的接触。在过去的一年中,已经安装了气态氦制冷系统,以简化冷却腔室的物流。还安装了前室,以用作被测传感器的腔室。 WISP阵列已安装在源箱中。通过使用热扼流圈将阵列连接到冷表面,然后通过加热元件主动控制温度,从而开发出了一种热控制系统。这样就可以在用户选择的,稳定的基板温度(从环境温度到150 K以下)下操作阵列。此功能可以选择阵列操作的红外背景水平,并可以在足够的背景水平下操作用于测试高海拔/大气大气层的接触。 WISP阵列是为室温操作而设计的,但是在降低的温度下预期的性能似乎是可以接受的。测试是在KVACC离子源腔室内使用第一阶段原型WISP阵列进行的。给出了在各种基板温度下该阵列的辐射响应的数据。已证明该阵列可以在低至145 K的基板温度下运行。目前在源室中安装了两个3相WISP阵列和一个二向色合束器以进行2色测试。3

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