首页> 外文会议>Conference on holographic materials >Photosensitivity of As-S-based chalcogenide photoresists in the recording of relief phase holograms
【24h】

Photosensitivity of As-S-based chalcogenide photoresists in the recording of relief phase holograms

机译:As-S基硫族化物光刻胶在浮雕相全息图记录中的光敏性

获取原文

摘要

Abstract: The photosensitivity of As$-x$/Sb(Ge)$-y$/S$-100-x-y$/ (x equals 35 - 45, y equals 0 - 6) films to light with wavelength 488 nm was investigated. The value of photosensitivity was quantified using the results of chemical etching in amine solutions for as-deposited and exposed films. It was found the exposure required to obtain the optimal relief depth, which is from 0.1 to 0.3 micrometer for holographic gratings, decreases with both sulfur and antimony content from about 2 J/cm$+2$/ for As$-2$/S$-3$/ to about 0.3 J/cm$+2$/ for As$-30$/Sb$- 4$/S$-66$/. The photosensitivity of the Ge doped films is sharp decreased with Ge content. A model of effect of additives on the change of dissolution kinetics was proposed. It is based on the consideration of a photopolymerization of films leading to the formation of the insoluble network of AsS$-3/2$/ structural units. !8
机译:摘要:研究了As $ -x $ / Sb(Ge)$-y $ / S $ -100-xy $ /(x等于35-45,y等于0-6)膜对波长488 nm的光的光敏性。使用在胺溶液中化学蚀刻的结果,对沉积和曝光的薄膜定量光敏性的值。已发现获得最佳浮雕深度所需的曝光量,对于全息光栅为0.1至0.3微米,随着硫和锑含量的降低,曝光量约为2 J / cm $ + 2 $ / As $ -2 $ / S $ -3 $ /至约0.3 J / cm $ + 2 $ /为As $ -30 $ / Sb $ -4 $ / S $ -66 $ /。锗掺杂薄膜的光敏性随锗含量的增加而急剧下降。提出了添加剂对溶解动力学变化影响的模型。它基于对薄膜的光致聚合的考虑,该聚合导致形成AsS $ -3 / 2 $ /结构单元的不溶网络。 !8

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号