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Photosensitivity of As-S-based chalcogenide photoresists in the recording of relief phase holograms

机译:AS-S基硫属化物的光敏性在浮雕阶段全息图中的记录中的光致抗蚀剂

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The photosensitivity of As$-x$/Sb(Ge)$-y$/S$-100-x-y$/ (x equals 35 - 45, y equals 0 - 6) films to light with wavelength 488 nm was investigated. The value of photosensitivity was quantified using the results of chemical etching in amine solutions for as-deposited and exposed films. It was found the exposure required to obtain the optimal relief depth, which is from 0.1 to 0.3 micrometer for holographic gratings, decreases with both sulfur and antimony content from about 2 J/cm$+2$/ for As$-2$/S$-3$/ to about 0.3 J/cm$+2$/ for As$-30$/Sb$- 4$/S$-66$/. The photosensitivity of the Ge doped films is sharp decreased with Ge content. A model of effect of additives on the change of dissolution kinetics was proposed. It is based on the consideration of a photopolymerization of films leading to the formation of the insoluble network of AsS$-3/2$/ structural units.
机译:调查了AS $ -X $ / SB(GE)$ - Y $ / S $ -100-X-Y $ /(x等于35 - 45,y等于0 - 6)薄膜的光敏性进行了调查到具有波长488nm的光。使用胺溶液中的化学蚀刻结果来定量光敏性值,用于沉积和曝光膜。发现获得最佳浮雕深度所需的曝光,该深度为90.1至0.3微米用于全息光栅,随着约2J / cm $ + 2 $ /持续为$ -2 $ / s的硫磺和锑含量减少$ -3 $ /约0.3 j / cm $ + 2 $ /适用于-30美元$ / sb $ - 4 $ / s $ -66 $ /。 GE掺杂薄膜的光敏性随GE含量的急剧降低。提出了添加剂对溶解动力学变化的影响模型。它基于对薄膜光聚合的考虑,导致形成ass $-$-2 $ /结构单元的不溶性网络。

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