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Flash Photoelectron Microscopy of Nano- and Femtosecond Laser-Pulsed Surfaces

机译:纳米和飞秒激光脉冲表面的闪光光电子显微镜

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A time resolving (5ns) photoelectron microscope was applied to visualize transient effects produced by 10 ns and 100 fs laser pulses in covalent material (Si) and metals (Co, Pt) below the ablation threshold on the thermal time scale above 10 ns. Pulses with ns duration caused thermal melting, removal of oxide from Si and oxidation of freezing Co. Femtosecond pulses converted an oxide-covered Si surface to a foam and left plastic deformations in metals. These deformations are probably caused by pressure from the excited electron gas and by shear due to constrained thermal expansion.
机译:在时间大于10 ns的热时标上,应用时间分辨(5ns)光电子显微镜观察10 ns和100 fs激光脉冲在低于烧蚀阈值的共价材料(Si)和金属(Co,Pt)中的10 ns和100 fs激光脉冲产生的瞬态效应。持续时间为ns的脉冲引起热融化,从Si中去除氧化物并冻结Co的氧化。飞秒脉冲将被氧化物覆盖的Si表面转化为泡沫,并在金属中产生塑性变形。这些变形可能是由激发的电子气体产生的压力以及受约束的热膨胀引起的剪切引起的。

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