Accelerating test data processing

摘要

The speed of stimuli generation and response processing in mixed-signal BIST is often limited by the available operational throughput of the test circuitry (i.e., by the time taken to perform arithmetic operations required to produce test signals and to analyse the test responses). Application of the Messerschmitt transform known from the area of DSP can substantially increase the throughput by allowing pipelining not only feed-forward computations but also those related to the feedback (recursive) algorithms.