Abstract: We present the requirements and analysis of measurements of high frequency low intensity electromagnetic fields with particular focus on field perturbation by the measuring probe and the measurements in the near field region. To this end novel electric and magnetic field measurement systems (probes) utilizing semiconductor and optical technology have been developed, tested and calibrated in the frequency range up to 1.8 GHz. These probes show an outmost advantage over currently available measurement systems in that they are passive, all- dielectric and EMI immune. They also offer the possibility to measure field frequency and phase change if a reference signal is available. !16
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