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Light-induced metastable defects or light-induced metastable H atoms in a-Si:H films?

机译:A-Si:H薄膜中光诱导的亚稳态缺陷或光诱导的亚稳态H原子?

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In hydrogenated amorphous silicon (a-Si:H) films,the increase of the metastable defect density under high-intensity illumination is usually described by an empirical two-parameter stretched-exponential time dependence (characteristic time tau )_SE and dispersion parameter beta ).In this study,a clearly different (one-parameter) analytic function is obtained from a microscopic model based on the formation of metastable H (MSH) atoms in a-Si:H films.Assuming that MSH atoms are the only mobile species,only three chemical reactions are significant: MSH are produced from doubly hydrogenated (SiH HSi) configurations and trapped either at broken bounds or Si-H creation (LIC) of defects.Competition between trapping sites results in a saturation of N(t) at a steady-state value N_SS.A one-parameter fit of this analytical function to experimental data is generally good,indicating that the use of a statistical distribution of trap energies is not necessary.
机译:在氢化非晶硅(A-Si:H)薄膜中,在高强度照明下的亚稳缺陷密度的增加通常由经验两参数拉伸指数时间依赖(特征时间Tau)_SE和分散参数β)描述在本研究中,基于A-Si:H电影中的亚氯H(MSH)原子的形成,从微观模型获得明显不同的(一次参数)分析功能.ASP原子是唯一的移动物种,只有三种化学反应是显着的:MSH由双氢化(SIH HSI)配置产生并捕获在捕获网站之间的缺陷之间的破碎界限或Si-H创作(LIC),导致N(T)的饱和度该分析功能与实验数据的稳态值N_SS.A一个参数拟合通常很好,表明不需要使用陷阱能量的统计分布。

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