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Experimental determination of the distributionof tail states of hydrogenated amorphous silicon: a transient photocurrent analysis

机译:氢化非晶硅尾态分布的实验测定:瞬态光电流分析

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Recent experimental developments have cast doubt on the validity of the common assumption that the distribution of tail states of hydrogenated amorphous silicon exhibits a single exponential functional form.We employ transient photocurrent decay measurements to determine this distribution of tail states.In our approach,however,we determine the distribution of tail states directly from the experimetnal data,without assuming,a priori,a specific functional form.It is found that these experimental results are consistent with othe rmore recent experimental determinations of the distribution of tail states,suggesting the possibility of deviations from a single exponential distribution of tail states in hydrogenated amorphous silicon.
机译:最近的实验发展对常见假设的有效性施加了疑问,即氢化非晶硅的分布呈单个指数函数形式。我们采用瞬态光电流衰变测量来确定尾部的这种分布。然而,我们的方法,我们直接从实验数据确定尾态的分布,不假设先验,特定的功能形式。这些实验结果与OTHE RMORE最近的尾州分布的实验确定一致,表明可能性偏离尾态在氢化非晶硅中的单指数分布的偏差。

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