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Features of excess arsenic precipitation in LT-GaAs delta-doped with indium

机译:LT-Gaas Delta-掺杂铟的过量砷沉淀的特征

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The isovalent indium delta-doping of LT-GaAs films, performed additionally to a uniform one with shallow donors (Si) and acceptors (Be), is shown by TEM to provide As cluster arrays ordered along the growth direction. At the appropriate growth and annealing conditions As/GaAs layered insulating-semiconducting structures have been obtained with GaAs spacers free of clusters between As cluster sheets as thick as 30 nm. In parallel, the indium diffusivity in LT-GaAs is estimated to be 5x10~(-18) cm~2/s in the temperature range from 500 to 600 deg C.
机译:通过TEM表示诸如具有浅供体(Si)和受体(Si)和受体(Be)的均匀形式的LT-GaAs膜的不均法铟δ掺杂,以提供沿着生长方向排序的簇数阵列。在适当的生长和退火条件下,通过作为厚度为30nm的簇片之间的GaAs间隔物获得了AS / GaAs层状绝缘半导体结构。并行地,LT-GaAs中的铟扩散率估计为500至600℃的温度范围为5×10〜(-18)cm〜2 / s。

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