This paper presents an approach to support analysis and debugging of VLSI device test programs. In research into the previous work, we find that there are two restrictions in program debugging: computational complexity and diagnostic precision, which greatly influence the effect of program debugging. In the paper, we apply Fuzzy Mathematics, especially Fuzzy Comprehensive Evaluation, to research on fuzzy knowledge representation, fuzzy relation, and fuzzy inference, etc. in the test programs analysis. An algorithm for the selection of the test entities to be debugged is addressed.
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