首页> 外文会议>Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on >Proposal for a new methodology standard: simple near-field probe measurements of microwave leakage power from gasketed seams
【24h】

Proposal for a new methodology standard: simple near-field probe measurements of microwave leakage power from gasketed seams

机译:关于新方法标准的建议:简单的近场探头测量垫片接缝处的微波泄漏功率

获取原文

摘要

A simple methodology is described that employs small low-cost probes to measure the total microwave leakage power radiated from practical gasketed seams commonly used in shielding enclosures. This methodology is being proposed for adoption as a standard methodology from very low frequencies (VHF) to perhaps 18 GHz and higher. Experimental results are presented for frequencies between 0.2 and 8.0 GHz. Values of total radiated power measured using the probe methodology agree well with values obtained with the reverberation chamber method. At the present time, a total of only three methodologies are known to have acceptable accuracy /spl plusmn/(3 to 6) dB to qualify as standards, and these are summarized.
机译:描述了一种简单的方法,该方法采用小的低成本探头来测量从屏蔽外壳中的实际垫片接缝辐射的总微波泄漏功率。正在提出该方法作为从非常低频(VHF)到18 GHz和更高的标准方法。在0.2和8.0GHz之间的频率介绍了实验结果。使用探针方法测量的总辐射功率的值与用混响室方法获得的值吻合得很好。目前,已知只有三种方法可以具有可接受的精度/ SPL PLUSM /(3至6)DB以获得标准,并且这些总结。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号