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System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes

机译:使用近场微波探针定量测量材料复介电常数的系统和方法

摘要

A method for measuring a material's complex permittivity is provided where a near-field microwave probe is positioned a predetermined distance from a first and a second standard sample for measuring a relative resonant frequency shift of the near-field microwave probe for standard samples. Based on measurements, calibration coefficients are calculated. A relative resonant frequency shift of the near-field microwave probe for a sample under study is measured by fast frequency sweep technique while the distance between the tip of the probe and the sample under the study is maintained nominally at the distance between the tip of the probe and each standard sample during a calibration procedure by a shear-force based distance control mechanism. Also, the change in the quality factor of the probe for unloaded and loaded resonator is measured. The dielectric constant of the sample under study is calculated using the resonant frequency shift and the change in the quality factor of the near-field microwave probe for the sample under study and the calibration coefficients obtained during the calibration procedure.
机译:提供了一种用于测量材料的复介电常数的方法,其中将近场微波探头放置在距第一和第二标准样品预定距离处,以测量标准样品的近场微波探头的相对共振频率偏移。根据测量结果,计算校准系数。通过快速扫频技术测量被研究样品的近场微波探针的相对共振频率偏移,同时将探针尖端和被研究样品之间的距离名义上保持在被研究样品的距离之间。通过基于剪切力的距离控制机制在校准过程中测量探针和每个标准样品。另外,还测量了用于已加载和已加载谐振器的探头的品质因数变化。使用共振频率偏移,被研究样品的近场微波探头的品质因数变化以及在校准过程中获得的校准系数,计算被研究样品的介电常数。

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