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Different numerical methods for electromagnetic field computation with thin shielding sheets

机译:用薄屏蔽片计算电磁场的不同数值方法

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The disturbance of sensitive measurement and control equipment by electromagnetic fields is a central problem in electromagnetic compatibility. A removal or reduction of such a disturbance is achieved by thin shielding sheets, the optimum design of which nowadays can be found by numerical methods. This paper describes the principles of three new methods for this task. The first method is the conventional hybrid FEM/BEM-method, which analyzes a 3D distribution of the fields numerically in the interior of the shielding sheet as well as in its surroundings. In the case of linear shielding material the 3D discretization can be replaced by a 2D one on the shielding sheet surface in the second and third method. While the second method leads to a more appropriate FEM/BEM formulation for thin shielding sheets than the first one, the third one has the advantage that only a BEM formulation is needed to solve the problem. Some EMC applications and their results illustrate the use of the methods.
机译:电磁场对灵敏的测控设备造成的干扰是电磁兼容性的中心问题。通过薄的屏蔽片可以消除或减少这种干扰,如今可以通过数值方法找到其最佳设计。本文介绍了用于此任务的三种新方法的原理。第一种方法是常规的混合FEM / BEM方法,该方法从数值上分析了屏蔽板内部及其周围区域的3D分布。在线性屏蔽材料的情况下,可以用第二种方法和第三种方法在屏蔽片表面上用2D替换3D离散化。尽管第二种方法比第一种方法更适合用于薄屏蔽板的FEM / BEM配方,但第三种方法的优点是仅需要BEM配方即可解决该问题。一些EMC应用程序及其结果说明了这些方法的使用。

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