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Submillimeter wave response and noise in HTS Josephson junctions

机译:HTS Josephson交界处的亚毫米波响应和噪声

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Abstract: The IV curves and the direct detector response of HTS bicrystal grain-boundary Josephson junctions have been measured under submm-wave irradiation at frequencies 350-750 GHz. The Josephson oscillation spectrum has been measured using the Hilbert transformation of detection response dependence. The Josephson oscillation linewidth and corresponding value of effective noise is compared to the estimates from the dc measurements of noise rounding of IV curve. To separate sources of noise the direct measurements of junction's output noise has been performed at 1.5 GHz and low frequencies 0.5-20 kHz. !14
机译:摘要:在350-750 GHz的亚毫米波辐射下,测量了HTS双晶晶界约瑟夫森结的IV曲线和直接探测器响应。约瑟夫森振荡谱已使用检测响应依赖性的希尔伯特变换进行了测量。将约瑟夫森振荡线宽和有效噪声的相应值与IV曲线的噪声舍入的直流测量的估计值进行比较。为了分离噪声源,已经在1.5 GHz和0.5-20 kHz的低频下对结的输出噪声进行了直接测量。 !14

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