Dependence of contrast on probe/sample spacing with the magneto-optic Kerr effect scanning near-field magneto-optic microscope (MOKE-SNOM)

摘要

Abstract: A magneto-optic Kerr effect scanning near-field optical microscope is used to image a stripe domain wall in a Co/Pt multilayer sample. The microscope is an improved version of a type previously reported, which uses light scattering from surface plasmons in 20 - 40 nm Ag particles as a near-field probe. Data is presented for both the probe intensity and polarization contrast as a function of probe/sample spacing. Oscillatory behavior in both sets of data is reasonably explained with a simplified model of optical interference.!11