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Indicatrix measurement based on birefringence retardation using phase modulation technology

机译:使用相位调制技术基于双折射延迟的Intriicatrix测量

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Abstract: The measurement of 3D anisotropy, which is the measurement of an indicatrix n$-x$/, n$-y$/, n$-z$/ is made by the birefringence measurement with normal and inclined incidence of the light beam. Birefringence retardation contains a fast and a slow axis which are caused by the phase difference of two orthogonal light waves. Information obtained will be different, depending on whether the inclination of a sample is made around the fast axis or the slow axis. Also, depending on the sample to be measured, it is sometimes necessary to incline the sample by changing the azimuthal angle of the sample. Taking into account the recent developments mentioned above, an automatic measuring system of an indicatrix is discussed.!3
机译:摘要:3D各向异性的测量是通过对光束的法向和倾斜入射进行双折射测量而完成的,它是对tri n $ -x $ /,n $ -y $ /,n $ -z $ /的测量。 。双折射延迟包含由两个正交光波的相位差引起的快轴和慢轴。所获得的信息将有所不同,具体取决于样品的倾斜度是围绕快轴还是慢轴。另外,根据要测量的样品,有时有必要通过改变样品的方位角来使样品倾斜。考虑到上述最新发展,讨论了一种自动测量指标系统。3

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