The mobilities of negative ions in liquid dielectrics have been investigated by many researchers. On the other hand, there have been only limited reports on the mobility of positive carriers. To clarify the mechanisms of electrical conduction and breakdown in dielectric liquids, it is also very important to measure the mobilities of positive charge carriers including holes. In this paper the mobility of positive charge carrier in n-hexane was measured by using a thin film tunnel emitter (Al/spl middot/Al/sub 2/O/sub 3//spl middot/SiO/spl middot/Au). This tunnel emitter has excellent features to inject either electrons or holes into a liquid. The mobility was estimated from the transient currents with the time of flight method. The mobility of positive charge carrier was a constant value, 4.7/spl times/10/sup -4/ cm/sup 2/ V/sup -1/ s/sup -1/ for applied field strengths ranging from 50 to 140 kV cm/sup -1/. We discuss the carrier species including possible holes.
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机译：液体电介质中负离子的迁移率已被许多研究人员研究。另一方面，关于阳性携带者的迁移性的报道很少。为了阐明介电液体中的导电和击穿机理，测量包括空穴在内的正电荷载流子的迁移率也非常重要。本文采用薄膜隧道发射极（Al / spl middot / Al / sub 2 / O / sub 3 // spl middot / SiO / spl middot / Au）测量正电荷载流子在正己烷中的迁移率。该隧道发射器具有出色的功能，可以将电子或空穴注入液体中。通过飞行时间法从瞬变电流估计迁移率。正电荷载流子的迁移率为4.7 / spl乘以/ 10 / sup -4 / cm / sup 2 / V / sup -1 / s / sup -1 /的恒定值，适用于50至140 kV cm的施加场强/ sup -1 /。我们讨论了包括可能的孔在内的载体种类。
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