Maximization of injection energy during CS10 and CS11 EMP testing

摘要

Summary form only given. Subsystem testing for EMP, NEMP, and lightning is often performed by injecting damped-sinusoidal currents and voltages in cables and pins entering the equipment or subsystem under test (EUT). The relationship of the energy injected to an EUT and the energy delivered to the EUT was addressed at the 1989 IEEE EMP Symposium by R.M. McConnell. The authors claim that McConnell's treatment of the problem contained a fundamental error. This supposed error is addressed. The energy is calculated, assuming three different configurations of the input port under test. The present calculations imply that, in order to maximize the energy delivered to a load Z/sub t/ via a transmission line with characteristic impedance Z/sub g/, the source impedance must be minimized rather than matched to the characteristic impedance of the transmission line.