首页> 外文会议>Test Conference, 1989. Proceedings. Meeting the Tests of Time., International >A testing technique to characterize E/sup 2/PROM's aging and endurance
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A testing technique to characterize E/sup 2/PROM's aging and endurance

机译:表征E / sup 2 / PROM的老化和耐久性的测试技术

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The authors present a testing method for monitoring E/sup 2/PROM (electrically erasable programmable ROM) cell aging. The technique is not based on any particular assumption about cell technology: hence it can be used to characterize wearout dynamics in all cases in which charge trapped in tunnel oxide is the main failure mechanism. The method is validated by means of a wide set of measurements performed with automatic test equipment. The characterization can be directed to single cells, thus making it possible to study the main layout dependences of aging phenomena. Possible criticalities of the virgin devices (with respect to supply voltage temperature, etc.) can be determined. A procedure has been developed to extrapolate data obtained with a few programming cycles in order to obtain first-order estimates of the actual device endurance.
机译:作者提出了一种监视E / sup 2 / PROM(电可擦可编程ROM)单元老化的测试方法。该技术并非基于有关电池技术的任何特定假设:因此,在隧道氧化物中捕获的电荷是主要失效机制的所有情况下,它都可用于表征磨损动力学。该方法通过使用自动测试设备进行的大量测量而得到验证。可以针对单个单元进行表征,从而可以研究老化现象的主要布局依赖性。可以确定原始设备的可能临界度(相对于电源电压温度等)。已经开发出一种程序来推断通过几个编程周期获得的数据,以便获得实际设备耐用性的一阶估计。

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