The Omnitest system: a no-generate, no-compile, interactive test methodology

摘要

The authors present executable VLSI test software which reads a digital device specification file and dynamically reconfigures the tester at run time. The Omnitest concept has been demonstrated on the Megatest MegaOne VLSI tester. Complete device description files have gone from data manual to error-free-testing in under an hour. The Omnitest program completely masks the detailed operation of the MegaOne, yet allows the user to take advantage of all the tester's sophisticated features. Engineers who have had no previous exposure to test have been able to comprehend and utilize the input language after merely reviewing an example. Besides shortening development times and enabling a high-level approach to digital test, the Omnitest system also frees tester resources, standardizes test-related operations, and provides ample means to revise and amend.