A system is described for automatic test-pattern generation (ATPG) using symbolic representations and heuristics to attack the test problem at RT level, where redesigns to increase the testability are relatively cheap. In contrast to other ATPG tools based on RT-level hardware descriptions, KARATE includes tests for primitive operators and allows the modification and redefinition of fault models. KARATE has been implemented in Pascal on a VAX 11/750. The search algorithm, provisional libraries, and test program generators have been actually implemented and the heuristics included are tested. The final version of the library handler and a special pattern editor, which allows the comfortable specification of patterns, are under development.
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