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MICROMACHINING THROUGH SILICON SUBSTRATES BY ULTRAFAST LASER AT 1552 nm

机译:通过超快激光在1552 nm处通过硅基质进行微细化

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Micromachining of silicon (Si) using lasers isattracting much interest in the field of modernmicrofabrications. Because Si absorbs majority ofindustrial lasers in near-IR to uv region, laserprocessing of Si is usually performed using linearabsorption processes of the laser radiation.Micromachining by non-linear absorption processesinduced by short pulse lasers has many unique featuresand has been applied to transparent materials in manyfields. The application of these non-linear processes tothe micromachining of Si would be very advantageous.In this study, ultrafast pulses from a fiber-basedinfrared laser at 1552.5 nm were irradiated throughsilicon substrates such that they were focused at thefront or the rare surfaces of the substrates under aninfrared microscope. Focused outputs of the laser madesharp and deep trenches on the front surface. When thelaser was focused on a gold (Au) film on the surface ofthe second substrate placed at the back of the first Sisubstrate, the Au film was ablated by irradiationthrough the Si substrate. This was applied successfullyto an up-conversion of the frequency of crystaloscillator in a Si package. When the focus was placedat rear surface of a Si substrate and aberration of thelaser light caused by large refractive index of Si wascompensated, an Au film on the rear surface wasablated and deposited on another substrate placed atthe back of the substrate.
机译:使用激光对硅(Si)进行微加工是 在现代领域引起了极大的兴趣 微细加工。因为硅吸收了大部分 近红外至紫外区域的工业激光器,激光 Si的加工通常使用线性 激光辐射的吸收过程。 通过非线性吸收过程进行微加工 短脉冲激光感应具有许多独特的功能 并已应用于许多透明材料 领域。这些非线性过程的应用 Si的微加工将是非常有利的。 在这项研究中,基于光纤的超快脉冲 透过1552.5 nm的红外激光 硅基板,使它们专注于 基板正面或下方的稀有表面 红外显微镜。激光的聚焦输出 前表面上的锋利而深的沟槽。当。。。的时候 激光聚焦在金属表面的金(Au)膜上 第二衬底放置在第一硅的背面 在基板上,通过辐照烧蚀Au膜 通过硅衬底。这已成功应用 到晶体频率的上转换 Si封装中的振荡器。放置焦点时 在硅衬底的背面和像差 Si的大折射率引起的激光为 补偿后,后表面上的金膜被 烧蚀并沉积在放置于 基板的背面。

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