首页> 外文会议>International Conference on Mixed Design of Integrated Circuits and Systems >Process and Device Simulation of Schottky Barrier MOSFETs for Analysis of Current Injection
【24h】

Process and Device Simulation of Schottky Barrier MOSFETs for Analysis of Current Injection

机译:肖特基屏障MOSFET分析电流注入的工艺和装置仿真

获取原文

摘要

In this paper we focus on the implementation of a process flow of SB-MOSFETs into the process simulator of the Synopsys TCAD Sentaurus tool-chain. The improved structure containing topography is briefly discussed and further device simulations are applied with the latest physical models available for these type of devices. Afterwards, some key parameters are discussed and finally the results are compared with fabricated SB-MOSFETs in terms of accuracy and capability of process simulations.
机译:在本文中,我们专注于将SB-MOSFET的进程流的实现进入Synopsys TCAD Sentaurus工具链的过程模拟器。简要讨论了含有地形的改进结构,并使用这些类型的设备可用的最新物理模型应用了进一步的设备模拟。之后,讨论了一些关键参数,最后将结果与工艺模拟的精度和能力进行比较,与制造的SB-MOSFET进行比较。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号