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Performance enhancement of quantum dot infrared photodetector by periodic pillar array

机译:周期柱阵列量子点红外光电探测器的性能增强

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In this paper, we report enhanced performance of quantum dot infrared photodetector (QDIP) by means of surface plasmonic structure. A 10-layer InGaAs quantum dot (QD) structure with AlGaAs barriers were grown on GaAs(001) substrate by molecular beam epitaxy. A periodic gold pillar array was fabricated on the surface of the top contact layer by i-line lithography and ICP dry etching. The wafer was processed to form a circular mesa of 300 μm diameter. The pillar pitch was varied from 2.0 to 2.5 μm and the pillar diameter was varied from 1.1 to 1.6 μm. The detectors were illuminated from substrate side to evaluate spectral responsivity and detectivity D* at temperature T= 78 K. The pillar array was found to enhance the detector performance at particular wavelength which depends on the pillar property. We found the optimal property of the pillar array whose enhancement peak matches the QDIP's response peak at 7.7 μm. At that wavelength, the responsivity and detectivity were almost doubled compared to the detector without the pillar array.
机译:在本文中,我们通过表面等离子体结构报告了量子点红外光电探测器(QDIP)的增强性能。通过分子束外延在GaAs(001)衬底上生长具有AlgaAs屏障的10层InGaAs量子点(QD)结构。通过I线光刻和ICP干蚀刻在顶部接触层的表面上制造了周期性的金柱阵列。将晶片加工以形成直径为300μm的圆形台面。柱间距从2.0到2.5μm变化,柱直径从1.1到1.6μm变化。检测器从基板侧照射以在温度T = 78k处评估光谱响应度和探测器D *。发现柱阵列以提高特定波长的检测器性能,这取决于柱状。我们发现了柱子阵列的最佳特性,其增强峰与QDIP的响应峰值匹配为7.7μm。在该波长,与没有柱子阵列的检测器相比,响应性和探测几乎翻倍。

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