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The Study of Porosity and Photoluminescence Properties of Nanoporous Silicon Layer Under Anodization Current Density Formation by Double Tank Electrochemical Etching Cell

机译:双罐电化学蚀刻电池阳极氧化电流密度形成纳米多孔硅层孔隙率和光致发光性能研究

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This research presents the effect of the constant current density on nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon wafer. In this paper, the constant current density is increased from 10 mA/cm2 to 25 mA/cm2 during the anodization process by using hydrofluoric acid and ethanol at ratio 4:1 and the etching time are 10 minute. Gravimetric and Photoluminescence measurement were performed to investigate the porosity and the uniform distribution of nanoporous silicon layer respectively. The result shows that the porosity of nanoporous silicon layer was increased when the constant current density increased. The range of the porosity 46% to 80% and it is dependent on constant current density. The photoluminescence measurement with irradiate ultraviolet light on the surface of samples it was observed that hight uniformity of photoluminescence intensity. Indicates that the nanoporous silicon surface are more uniform distribution. This research discovers that the constant current density has large effect on the porosity of nanoporous silicon layer. Results show good improvement the nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon.
机译:该研究介绍了双箱电化学蚀刻电池在硅晶片背面涂覆铝的双罐电化学蚀刻电池对纳米多孔硅形成的恒流密度对纳米多孔硅形成的影响。在本文中,恒定电流密度从10 mA / cm增加 2 到25 mA / cm 2 在阳极氧化过程中,通过使用氢氟酸和乙醇以比例为4:1,蚀刻时间为10分钟。进行重量和光致发光测量以分别研究纳米多孔硅层的孔隙率和均匀分布。结果表明,当恒定电流密度增加时,纳米多孔硅层的孔隙率升高。孔隙率的范围46%至80%,并且它取决于恒定电流密度。用紫外线照射样品表面的光致发光测量,观察到光致发光强度的Hight均匀性。表示纳米多孔硅表面更均匀。该研究发现恒定电流密度对纳米多孔硅层的孔隙率有很大影响。结果表明,双罐电化学蚀刻电池的纳米多孔硅形成良好的改善,无需在硅的背面涂覆铝。

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