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Design and Analysis of Voltage Controlled Oscillators in 45nm CMOS Process

机译:45nm CMOS工艺中压控振荡器的设计与分析

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A Voltage Controlled Ring Oscillator, Current Starved Voltage Controlled Oscillator and Negative Skewed Oscillator are designed with system performance prioritized and layout drawn, considering their implementation in a Phase Locked Loop. Waveforms and parameters are compared at high performance and Layouts are designed with area under high priority. Layout Verification is done with Design Rule Check and Layout vs Schematic Assura quality checks. All the designs are implemented in 45nm technology node using gpdk45 technology Cadence Virtuoso System Design Platform.
机译:考虑到它们在锁相环中的实现,设计了压控环形振荡器,电流不足的压控振荡器和负偏斜振荡器,并优先考虑了系统性能并绘制了布局。在高性能下比较波形和参数,并以高优先级设计面积。布局验证是通过“设计规则检查”和“布局与原理图Assura”质量检查完成的。所有设计均使用gpdk45技术Cadence Virtuoso系统设计平台在45nm技术节点中实施。

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