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A Study on the Flexible Chip-on-Fabric (COF) Assembly using Anisotropic Conductive Films (ACFs) Materials

机译:使用各向异性导电膜(ACF)材料的柔性织物上芯片(COF)组件的研究

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摘要

In this study, flexible Chip-on-Fabric (COF) assemblies using anisotropic conductive films (ACFs) and cover layer structure were demonstrated. Fabric substrates were fabricated by Cu pattern lamination method with additional electroless nickel immersion gold (ENIG) metal finish before laminating onto the fabrics. Thermo-compression (T/C) bonding method was used to bond the 50µm-thick Si chip on the fabric substrates. After T/C bonding, stable ACFs joint interconnection was formed between chips and substrates. Polymer cover layer structure was applied on the flip-chip surface of the COF packages. After polymer cover layer structure was applied, minimum bending radius before chip crack drastically decreased down to 10 mm radius. In addition, a dynamic bending test was performed to evaluate the dynamic bending reliability of the COF assemblies with polymer cover layer structure, and cross-section SEM analysis and digital image correlation (DIC) method were used to analyze the bending test results.
机译:在这项研究中,展示了使用各向异性导电膜(ACF)和覆盖层结构的柔性织物上芯片(COF)组件。织物基材是通过Cu图案层压方法制造的,并在层压到织物上之前具有额外的化学镀镍沉金(ENIG)金属表面处理。使用热压(T / C)粘合方法将50μm厚的Si芯片粘合到织物基板上。经过T / C键合后,芯片和基板之间便形成了稳定的ACF接头互连。将聚合物覆盖层结构应用于COF封装的倒装芯片表面。施加聚合物覆盖层结构后,切屑裂纹之前的最小弯曲半径急剧减小至10 mm半径。此外,还进行了动态弯曲试验,以评估具有聚合物覆盖层结构的COF组件的动态弯曲可靠性,并使用截面SEM分析和数字图像相关(DIC)方法分析了弯曲试验的结果。

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