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RDL-1st Fan-Out Panel Level Packaging (FOPLP) for Heterogeneous and Economical Packaging

机译:用于异构和经济包装的RDL-1st扇出面板级包装(FOPLP)

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Established RDL-1st fan out panel level packaging (FOPLP) processes and modules for Gen 3 panel (550x650 mm) sizes. RDL-1st package test vehicle (TV) has been designed and fabricated with single chip size of 10x10mm and final package size is 15x15mm. IC test chip has been designed and fabricated with Al pad structures and copper pillars with solders for final package assembly. Extensive mechanical modelling and simulation studies have been conducted to provide optimum guide lines for process design and material selection. Multilayer RDL structures up to two layers have been fabricated with copper RDL line width and line spacing (LW/LS) of 8/8um. Number I/Os for this package is around 1000. Prior to final TV fabrication several short loop DOE evaluations have been conducted for material and process feasibility. A special mask set with test structures has been designed for short loop DOE and it includes LW/LS structures and meander structures from 1/1um to 15/15um, via opening structures from 3um to 20um. Established lithography process to resolve LW/LS patterns from 2/2um onwards. Several key modules for panel processing like seed layer deposition, plating, wet etching and final assembly, have been established by closely working with equipment and material suppliers.
机译:建立了适用于第三代面板(550x650 mm)尺寸的RDL-1st扇出面板级封装(FOPLP)工艺和模块。 RDL-1st封装测试车(TV)的设计和制造的单芯片尺寸为10x10mm,最终封装尺寸为15x15mm。 IC测试芯片的设计和制造具有Al焊盘结构和带有焊料的铜柱,用于最终封装。已经进行了广泛的机械建模和仿真研究,以为工艺设计和材料选择提供最佳指导。已经制造了多达两层的多层RDL结构,铜RDL的线宽和线距(LW / LS)为8 / 8um。该封装的I / O数量约为1000。在最终电视制造之前,已经针对材料和工艺的可行性进行了几项简短的DOE评估。针对短环DOE设计了具有测试结构的特殊掩模组,它包括LW / LS结构和1 / 1um至15 / 15um的曲折结构,以及3um至20um的开口结构。建立光刻工艺以解决从2 / 2um开始的LW / LS图案。通过与设备和材料供应商紧密合作,建立了一些用于面板处理的关键模块,例如种子层沉积,电镀,湿法蚀刻和最终组装。

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