Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms

摘要

Safety is one of the crucial features of autonomous drive platforms, and semiconductor chips used in these architectures must guarantee functional safety aspects mandated by ISO 26262 standard. To monitor the failures due to field defects, in-system-structural-tests are automatically run during key-on and/or key-off. Upon detection of any permanent defects by the in-system-test (IST) architecture, Drive platform responds to achieve the fail-safe state of the system. In this paper, we present the IST architecture that helps with achieving highest functional safety levels on the NVIDIA Drive platform.