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Empirical study of identifying gaps between users expectation and experience in the verification methodologies of semiconductor industry

机译:识别用户期望与经验的识别半导体产业验证方法的实证研究

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Independent of the application field, major factors in focus when using the products are quality, cost and time. Empirical studies have shown that in IC design projects as much as half of the projected schedule is spent on the verification activities. Our research work involved exploring the current state of practice of the verification process, investigating methods for achieving efficient fault detection during the product verification, implementation of accumulated knowledge and techniques for efficient verification in one real-world practical case and analysing the impact of the current verification process in terms of time, cost and quality of product verification. This paper covers the views of verification experts in semiconductor industry on latest verification techniques. It shows the most commonly used verification improvement activities that had been implemented by semiconductor companies and its impact on quality, cost and time of the products. The methodology encompassed survey and semi-structured interviews at VLSI companies. Experiments were done to evaluate the new verification methods before using them in real projects. This paper is mainly focussed on identifying the gaps between the expectation of the verification experts and their real experiences of latest verification techniques for product verification process in semiconductor industry.
机译:独立于应用领域,使用产品时,重点的主要因素是质量,成本和时间。实证研究表明,在IC设计项目中,在预计计划的一半上都花在验证活动上。我们的研究工作涉及探索当前验证过程的实践状态,研究了在产品验证期间实现有效故障检测的方法,实现了一个真实的实际情况下有效验证的累积知识和技术,并分析了当前的影响在产品核查的时间,成本和质量方面验证过程。本文涵盖了最新验证技术的半导体行业验证专家的观点。它显示了半导体公司实施的最常用的验证改善活动及其对产品质量,成本和时间的影响。该方法包括VLSI公司的调查和半结构性访谈。进行实验以评估在实际项目中使用它们之前的新验证方法。本文主要侧重于确定验证专家期望之间的差距及其半导体行业产品验证过程的最新验证技术的实际经验。

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