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Long-Term Tum-by-Tum Measurements of Electron bunch Profiles at MHz Repetition Rates in a Storage Ring with Single-Shot Electro-Optical Sampling

机译:使用单次电光采样在存储环中以MHz重复速率对电子束分布进行长期逐项Tum测量

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At the KArlsruhe Research Accelerator (KARA), we use electro-optical sampling to measures profiles of compressed electron bunches during the microbunching instability. The observation of the complex dynamics of this instability is of special interest because it leads to intense THz radiation bursts. As the revolution frequency of the storage ring is 2.72 MHz, high detection rates are required to record the bunch profiles for every revolution with single-shot measurements. To achieve fast detection rates, we implemented a KIT-developed ultra-fast line array and recorded the electron bunch charge density for every revolution for 3.6 s with a data throughput of 1.4 GBytes/s.
机译:在卡尔斯鲁厄研究加速器(KARA),我们使用电光采样来测量微束不稳定性过程中压缩电子束的分布。对这种不稳定性的复杂动力学的观察特别令人感兴趣,因为它会导致强烈的THz辐射猝发。由于存储环的旋转频率为2.72 MHz,因此需要高检测率才能通过单次测量记录每次旋转的束轮廓。为了实现快速检测率,我们实施了KIT开发的超快速线阵列,并记录了每转3.6 s的电子束电荷密度,数据吞吐率为1.4 GBytes / s。

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