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首页> 外文期刊>Physical review letters >Electro-Optic Technique with Improved Time Resolution for Real-Time, Nondestructive, Single-Shot Measurements of Femtosecond Electron Bunch Profiles
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Electro-Optic Technique with Improved Time Resolution for Real-Time, Nondestructive, Single-Shot Measurements of Femtosecond Electron Bunch Profiles

机译:具有改进的时间分辨率的电光技术,用于飞秒电子束轮廓的实时,无损,单次测量

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摘要

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (~ 275 fs rms) long bunches.
机译:相对论电子束的库仑场的电光检测与光脉冲的单次互相关相结合,可用于单次测量飞秒电子束的形状和长度。该方法克服了先前单次电光测量的基本时间分辨率限制,该限制是由探测光脉冲的时间和频率属性的不可分割性引起的。使用这种新技术,我们对50 MeV电子束进行了实时测量,观察了650 fs FWHM(〜275 fs rms)长束的轮廓。

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