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Experimental Study and Modeling of the gm-I Dependence of Long-Channel MOSFETs

机译:长沟道MOSFET的g m -I相关性的实验研究和建模

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This paper describes an experimental study and modeling of the current-transconductance dependence of the ALD1106 and ALD1107 arrays. The study tests the hypothesis that the I-gm dependence of these 7.8 μm MOSFETs conforms to the Advanced Compact Model (ACM). Results from performed measurements, however, do not support this expectation. Despite the relatively large length, both ALD1106 and ALD1107 show sufficiently pronounced `short-channel' effects to render the ACM inadequate. As a byproduct of this effort, we confirmed the modified ACM equation. With an m factor of approximately 0.6, it captures the I-gm dependence quite well. The paper also introduces several formulas and procedures for I-gm model extraction and tuning. These are not specific to the ALD transistor family and can be applied to MOSFETs with different physical size and electrical performance.
机译:本文介绍了ALD1106和ALD1107阵列的电流跨导相关性的实验研究和建模。研究检验了I-g的假设 m 这些7.8μmMOSFET的相关性符合高级紧凑模型(ACM)。但是,执行的测量结果不支持此预期。尽管长度相对较大,但ALD1106和ALD1107均显示出足够明显的“短通道”效应,从而使ACM不足。作为这项工作的副产品,我们确认了修改后的ACM方程。 m因子约为0.6,它可以捕获I-g m 依赖性很好。本文还介绍了I-g的几种公式和程序 m 模型提取和调整。这些并非特定于ALD晶体管系列,可以应用于具有不同物理尺寸和电气性能的MOSFET。

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