首页> 外文会议>International conference on nuclear engineering >STUDY ON VARIATION OF HPGE DETECTOR DEAD LAYER THICKNESS AND ITS EFFECT ON THE MEASUREMENTS OF THE DETECTOR RESPONSE AND SAMPLES CHARACTERIZATION USING MONTE CARLO SIMULATION
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STUDY ON VARIATION OF HPGE DETECTOR DEAD LAYER THICKNESS AND ITS EFFECT ON THE MEASUREMENTS OF THE DETECTOR RESPONSE AND SAMPLES CHARACTERIZATION USING MONTE CARLO SIMULATION

机译:蒙特卡罗模拟研究HPGE探测器死层厚度的变化及其对探测器响应和样品表征测量的影响

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The main objective of this work is to produce an optimal modeling for our aged Planar-HPGe detector using Monte Carlo method (MC). That optimization included the analysis of the germanium dead (inactive) layer thickness for our old detection system (planar-HPGe detector). DL is one of the important parameters needed in order to obtain the smallest discrepancy between simulated and experimental measurements of detector efficiency. Also, precise determination of ~(235)U enrichment for UO_2 samples which is necessary for purposes of nuclear materials verification in the field of nuclear safeguards. The thickness of Germanium dead layer (DL) can be vary by time as it is not well known due to the existence of a transition zone where photons are strongly attenuated and absorbed, that cannot contribute to the total photon energy absorption which causes a significant decrease in efficiency. Therefore, using data provided by manufacturers since long years (manufacture date) in the detector simulation model is not convenient. As a result, some strong discrepancies appear between measured and simulated efficiency, in addition to that non-accurate results for ~(235)U enrichment determination. The Monte Carlo method applied to overcome this difficulty was to vary the thickness of dead layer step by step in simulation, a good agreement (minimum deviation) between estimated and experimental efficiency was reached when a suitable germanium dead layer thickness was chosen. Calculations and measurements were performed for radioactive nuclear material samples in the form of UO_2 powder with different sizes and enrichments at different locations, under different gamma-lines emitted after a-decay of the 235U nuclei. Results indicated that a good agreement between simulated and measured efficiencies is obtained using a value for the germanium dead layer thickness approximately (2.45 mm) six in comparison with (0.389 mm) provided by the detector manufacturer.
机译:这项工作的主要目的是使用蒙特卡罗方法(MC)为我们的老化的Planar-HPGe检测器产生一个最佳模型。该优化包括分析旧检测系统(平面HPGe检测器)中的锗死(非活性)层厚度。 DL是获得检测器效率的模拟测量与实验测量之间的最小差异所需的重要参数之一。同样,精确确定UO_2样品的〜(235)U富集,这对于核保障领域中核材料的核实是必要的。锗死层(DL)的厚度可以随时间变化,因为它不为人所知,这是因为存在过渡区,在该过渡区中光子被强烈衰减和吸收,而该过渡区无法促进总光子能量吸收,从而导致光子的显着减少在效率上。因此,在检测器仿真模型中使用制造商提供的已存在很长时间(制造日期)的数据是不方便的。结果,除了〜(235)U富集测定的不准确结果外,在实测效率与模拟效率之间还存在一些强烈差异。蒙特卡罗方法应用于克服这一困难是在通过模拟步骤,以改变死层步骤的厚度,估算和实验效率之间的良好的一致性(最小偏差)被选为合适的锗死层厚度时达到。对235U核衰变后发射的不同伽玛线下不同位置和位置的UO_2粉末形式的放射性核材料样品进行了计算和测量。结果表明,与检测器制造商提供的(0.389 mm)相比,使用约(2.45 mm)六的锗死层厚度值可以在模拟效率和测量效率之间取得良好的一致性。

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