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Requirements for first-time-right response in advanced manufacturing

机译:先进制造中首次获得正确响应的要求

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The rapid pace of device scaling in recent years has outrun the ability of today's generation of semiconductor manufacturing equipment control systems to keep up. New device architectures and the materials and processes used to realize them create sources of variability that require better techniques for real-time sensing, filtering, detection, and response. This is not simply a question of faster data collection of the existing equipment variables. In many cases, the data needed to accurately determine the real-time process conditions are not even available in the equipment, so the traditional time-based techniques and endpoint detection methods for controlling recipe execution are not sufficient... rather, these advanced processes are effectively "flying blind." GLOBALFOUNDRIES, a long-time leader in equipment automation and process control, has addressed these issues by integrating specialty sensors into the broader control environment, effectively closing this gap through a variety of advanced sensorization initiatives that supplement the capabilities of the equipment as delivered by the OEMs. The broad expectations regarding the capabilities of manufacturing equipment and the embedded control systems have recently been described in [1]. Specific examples of advanced sensorization use cases and a standards-based implementation approach have been described in [2]. Now that the measurement gaps for a number of key processes have thus been closed (see Tables 1 and 2), new application opportunities exist for leveraging this enhanced visibility into equipment and process behavior. In particular, the ability to achieve "first-time-right response" to a wide variety of process conditions is now a practical reality. This paper highlights a number of these applications possibilities enabled by "unambiguous signals" on the equipment, and touches on the integration solution used to present these signals seamlessly to the application environment.
机译:近年来,设备扩展的快速步伐已经超出了当今的半导体制造设备控制系统的跟上能力。新的设备架构以及用于实现它们的材料和过程创建了可变性的源头,这些可变性的源头需要用于实时感测,过滤,检测和响应的更好的技术。这不仅仅是简单地收集现有设备变量的数据的问题。在许多情况下,设备中甚至无法获得准确确定实时过程条件所需的数据,因此,传统的基于时间的技术和用于控制配方执行的终点检测方法还不够...这些先进的过程实际上是“盲目飞行”。 GLOBALFOUNDRIES是设备自动化和过程控制领域的长期领导者,已通过将专用传感器集成到更广泛的控制环境中来解决这些问题,并通过各种先进的传感器化措施有效地弥补了这一差距,这些措施补充了设备所提供的设备功能。 OEM。最近在[1]中描述了对制造设备和嵌入式控制系统功能的广泛期望。先进的传感器化用例和基于标准的实现方法的特定示例已在[2]中进行了描述。既然现在已经弥合了许多关键过程的测量差距(见表1和2),则存在新的应用机会,可以利用这种对设备和过程行为的增强可视性。尤其是,实现对多种工艺条件的“首次使用权响应”的能力现在已成为现实。本文重点介绍了设备上的“明确信号”所带来的多种应用可能性,并介绍了用于将这些信号无缝呈现给应用环境的集成解决方案。

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