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Carrier Mobility Effect of Electron Transporting Layer on OLED Performance

机译:电子传输层的载流子迁移率对OLED性能的影响

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Precise optimization and modeling of electron-hole recombination probability in organic light-emitting diodes (OLEDs) are necessary for developing a comprehensive description of their functioning. High-performance organic materials, new device architecture and advanced processing technologies are developed to emerge the development of the OLED community. It is well acknowledged that electrical processes in the OLEDs include three key steps, i.e. charge injection, charge transport, and charge recombination. In this paper, we demonstrate a quantitative approach to investigate the effects of carrier mobility of electron transporting layer (ETL) on electric field and recombination profile across the organic layers of the device using software package SETFOS. The simulation outcomes proposed that a higher electron mobility results in a wider recombination zone in the desired emissive layer (EML), while narrower in case hole mobility is comparatively higher.
机译:对有机发光二极管(OLED)中的电子-空穴复合概率进行精确的优化和建模对于开发其功能的全面描述是必要的。高性能有机材料,新的设备架构和先进的处理技术得到了发展,以形成OLED社区的发展。众所周知,OLED中的电气工艺包括三个关键步骤,即电荷注入,电荷传输和电荷复合。在本文中,我们演示了一种定量方法,该方法使用软件包SETFOS研究电子传输层(ETL)的载流子迁移率对整个器件有机层中电场和重组曲线的影响。模拟结果表明,较高的电子迁移率会在所需的发射层(EML)中产生更宽的复合区,而在空穴迁移率相对较高的情况下会变窄。

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