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The Research of Application Reliability and Failure Modes of Wire Bonding Process

机译:引线键合工艺的应用可靠性和失效模式研究

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Gold wire bonding is one of the key technologies in high-reliability packaging process, and widely used in electronic components required high reliability. This paper studied the typical process and reliability control methods of gold wire bonding, analyzed the effect of parameters such as bond power, bond time and bond force on bonding quality, and then further studied the typical failure modes and failure causes such as cracks in the neck, pad corrosion, bond pits and purple plague.
机译:金线键合是高可靠性封装过程中的关键技术之一,并广泛用于要求高可靠性的电子元件中。本文研究了金线键合的典型过程和可靠性控制方法,分析了键合功率,键合时间和键合力等参数对键合质量的影响,然后进一步研究了金丝键合的典型失效模式和裂纹产生的原因。颈部,护垫腐蚀,粘结凹坑和紫色鼠疫。

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