The Design of RFID Testing Channel Based on Direct Digital Synthesis Chip

摘要

In recent years, radio frequency identification (RFID) technology has been widely used in many fields. Thus, how to reduce the price of testing RFID chip become a key problem which must be considered by chip manufacturer and test equipment supplier now. As an important part of carrier generator, direct digital synthesis chip play a key role in RFID testing system. In the paper, a new and economical design of RFID testing channel based on direct digital synthesis chip is discussed.