首页> 外文会议>IEEE Electron Devices Technology and Manufacturing Conference >Short Flow Characterization Vehicle (Test Chip) Usage in Advanced Technology Development and Yield Improvement
【24h】

Short Flow Characterization Vehicle (Test Chip) Usage in Advanced Technology Development and Yield Improvement

机译:短流表征车辆(测试芯片)在先进技术开发和产量提高中的使用

获取原文

摘要

Short flow Characterization Vehicles® can be used at early development phase and offer short learning cycles. Their main usage is to support patterning scheme, validate and freeze design rules, identify and solve major integration and process issues. They have been proven to work for BEOL, FEOL, MOL, and for BEOL-integrated embedded memory elements.
机译:短流量表征车辆®可以在早期开发阶段使用,并提供较短的学习周期。它们的主要用途是支持图案化方案,验证和冻结设计规则,识别并解决主要的集成和流程问题。它们已被证明可用于BEOL,FEOL,MOL以及BEOL集成的嵌入式存储元件。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号