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Pushing the limit of lithography for patterning two-dimensional lattices in III-V semiconductor quantum wells

机译:推动III-V半导体量子阱中图案化二维格子的光刻限制

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Building two-dimensional lattices in semiconductor quantum-wells offers the prospect to design distinct energy-momentum dispersions, including conical intersections and nondispersive bands. Here, we compare three lithographic patterning methods, e-beam lithography, block copolymer lithography and thermal scanning probe lithography to produce a honeycomb lattice in an In0.53Ga0.47As quantum well. We weigh up the pros and cons of each method to reach lattice constants smaller than 20 nm with a minimum of dispersion in the pore size.
机译:在半导体量子井中建立二维格子,提供了设计不同的能量动量分散体的前景,包括锥形交叉和非分散带。 这里,我们比较三种平版图案化方法,电子束光刻,嵌段共聚物光刻和热扫描探针光刻,以在进入中产生蜂窝格 0.53 GA. 0.47 随着量子阱。 我们称重每种方法的优缺点,以达到小于20nm的晶格常数,在孔径中最小的分散体。

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