Ionizing Radiation Response of the 4530 Parallel-to- Serial Driver and 4527 Registered Receiver

摘要

The Northrop Grumman 4530 Parallel-to-Serial Driver and 4527 Registered Receiver align and convert 12-bit parallel data to single-ended serial streams. The devices were evaluated for functionality and shifts in logic levels, operating voltages, input currents, timing and power dissipation following exposure to moderate doses of ionizing radiation and post-irradiation anneal. Neither irradiation nor post-irradiation anneal has a measurable effect on the performance parameters. The radiation hardness of the devices is attributed in part to a p-implant in the field regions.