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SEL and cell failures in MRAM under ion and focused laser irradiation

机译:离子和聚焦激光照射下MRAM中的SEL和单元故障

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摘要

MRAM cell permanent failures was observed along with SEL under laser and ion beam irradiation. Sample preparation for back side was proposed to safe MRAM functionality and to allow focused laser irradiation though the substrate of MRAM die.
机译:在激光和离子束辐照下,观察到MRAM单元永久失效以及SEL。提出了用于背面的样品制备方法,以确保MRAM功能安全并允许通过MRAM芯片的基板进行聚焦激光辐照。

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